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Issue No.02 - April (vol.30)
ISSN: 0740-7475
TABLE OF CONTENTS
Papers
[Front cover] (Abstract)
pp. C1
[Masthead] (Abstract)
pp. 1
Table of contents (Abstract)
pp. 2
Table of contents (Abstract)
pp. 3
Andre Ivanov , IEEE Design & Test,
pp. 4
Swarup Bhunia , Electrical Engineering and Computer Science, Case Western Reserve University, Cleveland, OH, USA
Dakshi Agrawal , IBM TJ Watson Research Center , Yorktown Heights, USA
Leyla Nazhandali , Virginia Tech , Blacksburg,
pp. 5-7
Kan Xiao , ECE Dept., Univ. of Connecticut, Storrs, CT, USA
Xuehui Zhang , ECE Dept., Univ. of Connecticut, Storrs, CT, USA
Mohammad Tehranipoor , ECE Dept., Univ. of Connecticut, Storrs, CT, USA
pp. 26-34
J. Rajendran , Polytech. Inst., New York Univ., New York, OH, USA
A. K. Kanuparthi , Polytech. Inst., New York Univ., New York, NY, USA
M. Zahran , New York Univ., New York, NY, USA
S. K. Addepalli , Cisco, USA
G. Ormazabal , Columbia Univ., New York, NY, USA
R. Karri , Polytech. Inst., New York Univ., New York, OH, USA
pp. 35-44
pp. 65
P. Reviriego , Univ. Antonio de Nebrija, Madrid, Spain
C. J. Bleakley , Univ. Antonio de Nebrija, Madrid, Spain
J. A. Maestro , Univ. Coll. Dublin, Dublin, Ireland
pp. 87-95
IEEE Phaser Data (Abstract)
pp. 96
CEDA Currents (Abstract)
pp. 97-98
Theo Theocharides , Department of Electrical and Computer Engineering, University of Cyprus, Nicosia, Cyprus
pp. 100-101
IEEE Was Here (Abstract)
pp. 102
C. Fletcher , MIT CSAIL, Cambridge, MA, USA
M. van Dijk , MIT CSAIL, Cambridge, MA, USA
S. Devadas , MIT CSAIL, Cambridge, MA, USA
pp. 103-104
pp. C3
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