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IEEE Design & Test of Computers
Feb. 2013 (vol. 30 no. 1)
ISSN: 0740-7475
Table of Contents
Papers
S. Hirsch, Syst. & Technol. Group, IBM Corp., Essex Junction, VT, USA
U. Finkler, Syst. & Technol. Group, IBM Corp., Essex Junction, VT, USA
pp. 17-25
Fang Gong, Univ. of California, Los Angeles, Los Angeles, CA, USA
Wei Wu, Univ. of California, Los Angeles, Los Angeles, CA, USA
R. Krishnan, Univ. of California, Los Angeles, Los Angeles, CA, USA
Lei He, Nanyang Technol. Univ., Singapore, Singapore
Hao Yu, Nanyang Technol. Univ., Singapore, Singapore
pp. 26-35
R. Daniels, Synopsys, Mountain View, CA, USA
S. W. Wedge, Synopsys, Mountain View, CA, USA
H. von Sosen, Synopsys, Mountain View, CA, USA
pp. 36-44
Weiwei Chen, Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA, USA
Xu Han, Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA, USA
Che-Wei Chang, Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA, USA
R. Domer, Center for Embedded Comput. Syst., Univ. of California, Irvine, Irvine, CA, USA
pp. 45-54
Time Is Money (Abstract)
G. Smith, Gary Smith EDA, Santa Clara, CA, USA
pp. 55-57
P. H. Madden, Comput. Sci. Dept., SUNY Binghamton, Birmingham, NY, USA
pp. 58-64
Theo Theocharides, Department of Electrical and Computer Engineering, University of Cyprus, Nicosia, Cyprus
pp. 87-88
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