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Issue No.01 - Feb. (2013 vol.30)
pp: 26-35
Hao Yu , Nanyang Technol. Univ., Singapore, Singapore
The authors present a methodology geared towards EDA applications such as parasitic extraction, transient circuit simulation, and RF steady-state simulations.
parallel processing, electronic design automation, electronic design automation, parallelism, data dependency elimination, circuit simulation algorithm, EDA application, parasitic extraction, transient circuit simulation, RF steady-state simulation, Sparse matrices, Algorithm design and analysis, Integrated circuit modeling, Program processors, Circuit simulation, Parallel processing, Data processing, Circuit Simulation, Parallelism and concurrency, Data dependencies, Parallel Algorithms
Hao Yu, "Exploiting Parallelism by Data Dependency Elimination: A Case Study of Circuit Simulation Algorithms", IEEE Design & Test of Computers, vol.30, no. 1, pp. 26-35, Feb. 2013, doi:10.1109/MDT.2012.2226201
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