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Issue No.06 - Dec. (vol.29)
ISSN: 0740-7475
TABLE OF CONTENTS
pp. C1
Departments (PDF)
pp. 3
Alberto Valdes-Garcia , IBM T.J. Watson Research Center , Yorktown Heights, NY, USA
pp. 5-6
R. B. Staszewski , Dept. of Microelectron., Delft Univ. of Technol., Delft, Netherlands
pp. 7-18
D. Markovic , Univ. of California, Los Angeles, Los Angeles, CA, USA
pp. 19-26
M. F. Chang , Univ. of California, Los Angeles, Los Angeles, CA, USA
pp. 40-51
Erik Jan Marinissen , imec, Leuven, Belgium, Leuven, Belgium
pp. 52-55
M. Horowitz , Electr. Eng. Dept., Stanford Univ., Stanford, CA, USA
pp. 57-65
P-J Gil-Vicente , Dept. de Inf. de Sist. y Comput., Univ. Politec. de Valencia (UPV), Valencia, Spain
pp. 66-73
P. D. Franzon , Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
pp. 74-83
A. B. Kahng , Dept. of Comput. Sci. & Eng., Univ. of California at San Diego, La Jolla, CA, USA
pp. 101-102
pp. 108-109
Theo Theocharides , Department of Electrical and Computer Engineering, University of Cyprus, 75 Kallipoleos Avenue, Nicosia, Cyprus
pp. 111-112
pp. C3
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