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Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits
Dec. 2012 (vol. 29 no. 6)
pp. 74-83
Paul D. Franzon, Electrical and Computer Engineering, North Carolina State University, Raleigh , NC, USA
Michael B. Steer, Electrical and Computer Engineering, North Carolina State University, Raleigh , NC, USA
Ting Zhu, Electrical and Computer Engineering, North Carolina State University, Raleigh ,
Editor's notes:
Index Terms:
Integrated circuit modeling,Mathematical model,Adaptation models,Radio frequency,Noise measurement,Calibration,Integrated circuits,Voltage control,design aids,self-calibration,integrated circuit,analog,RF,optimization,process-voltage-temperature variation,surrogate modeling,yield
Citation:
Paul D. Franzon, Michael B. Steer, Ting Zhu, "Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits," IEEE Design & Test of Computers, vol. 29, no. 6, pp. 74-83, Dec. 2012, doi:10.1109/MDT.2012.2220332
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