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Issue No.06 - Dec. (2012 vol.29)
pp: 74-83
P. D. Franzon , Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
Analog circuits designed in submicrometer nodes suffer from process variations, typically requiring calibration in order to center their performance parameters and to recover yield loss. This article presents a design flow to find appropriate tuning knob settings to compensate for different process variation scenarios.
Integrated circuit modeling, Mathematical model, Adaptation models, Radio frequency, Noise measurement, Calibration, Integrated circuits, Voltage control,design aids, self-calibration, integrated circuit, analog, RF, optimization, process-voltage-temperature variation, surrogate modeling, yield
P. D. Franzon, "Surrogate Model-Based Self-Calibrated Design for Process and Temperature Compensation in Analog/RF Circuits", IEEE Design & Test of Computers, vol.29, no. 6, pp. 74-83, Dec. 2012, doi:10.1109/MDT.2012.2220332
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