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Issue No.06 - Dec. (2012 vol.29)
pp: 91-99
Huaxing Tang , Mentor Graphics Wilsonville , Oregon, USA
Kathy Yang , Mentor Graphics Wilsonville , Oregon, USA
Geir Eide , Mentor Graphics Wilsonville , Oregon, USA
Markus Seuring , Advantest Europe Böblingen , Germany
Michael Braun , Advantest Europe Böblingen , Germany
Alan Ma , Advanced Micro Devices, Inc. , Toronto, Canada
Editor's notes:
Automatic test pattern generation, Standards, Operating systems, Graphics processing unit
Huaxing Tang, Kathy Yang, Geir Eide, Markus Seuring, Michael Braun, Alan Ma, "Employing the STDF V4-2007 Standard for Scan Test Data Logging", IEEE Design & Test of Computers, vol.29, no. 6, pp. 91-99, Dec. 2012, doi:10.1109/MDT.2012.2210533
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