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Issue No.06 - Dec. (2012 vol.29)
pp: 91-99
Alan Ma , Advanced Micro Devices, Inc. , Toronto, Canada
ABSTRACT
Editor's notes:
INDEX TERMS
Automatic test pattern generation, Standards, Operating systems, Graphics processing unit
CITATION
Alan Ma, "Employing the STDF V4-2007 Standard for Scan Test Data Logging", IEEE Design & Test of Computers, vol.29, no. 6, pp. 91-99, Dec. 2012, doi:10.1109/MDT.2012.2210533
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