This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Employing the STDF V4-2007 Standard for Scan Test Data Logging
Dec. 2012 (vol. 29 no. 6)
pp. 91-99
Huaxing Tang, Mentor Graphics Wilsonville , Oregon, USA
Kathy Yang, Mentor Graphics Wilsonville , Oregon, USA
Geir Eide, Mentor Graphics Wilsonville , Oregon, USA
Markus Seuring, Advantest Europe Böblingen , Germany
Michael Braun, Advantest Europe Böblingen , Germany
Alan Ma, Advanced Micro Devices, Inc. , Toronto, Canada
Editor's notes:
Index Terms:
Automatic test pattern generation,Standards,Operating systems,Graphics processing unit
Citation:
Huaxing Tang, Kathy Yang, Geir Eide, Markus Seuring, Michael Braun, Alan Ma, "Employing the STDF V4-2007 Standard for Scan Test Data Logging," IEEE Design & Test of Computers, vol. 29, no. 6, pp. 91-99, Dec. 2012, doi:10.1109/MDT.2012.2210533
Usage of this product signifies your acceptance of the Terms of Use.