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Issue No.06 - Dec. (2012 vol.29)
pp: 91-99
ABSTRACT
This paper focuses on the V4-2007 extension of the Standard Test Data Format (STDF). STDF has been used as the standard representation for logging test data from automatic test equipment (ATE). This format however lacked a key capability, i.e., storing scan test results. The V4-2007 extension of this standard, as described in this paper, provides details on its ability in efficiently storing scan test results. Thus this standard now provides a complete and unified repository to store the results of parametric tests, functional tests and scan tests, all in a consistent format to aid in fault diagnosis and yield learning. This has in turn simplified the test flow and tracking of all necessary data to ensure more time-efficient testing and failure diagnosis.
INDEX TERMS
Automatic test pattern generation, Standards, Operating systems, Graphics processing unit,
CITATION
Huaxing Tang, "Employing the STDF V4-2007 Standard for Scan Test Data Logging", IEEE Design & Test of Computers, vol.29, no. 6, pp. 91-99, Dec. 2012, doi:10.1109/MDT.2012.2210533
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