The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.06 - Dec. (2012 vol.29)
pp: 84-90
ABSTRACT
This paper presents the details of a standard, named OpenDFM, which describes an efficient method to ensure manufacturability of integrated circuits that are designed at advanced technology nodes of today and one that can scale to address similar issues at future nodes as well. OpenDFM uses a meta-language format to capture and improve critical patterns that must be tested to ensure correct manufacturing and thus enhance yield.
INDEX TERMS
Semiconductor device manufacture, Semiconductor device packaging, System-on-a-chip, Schedules, Economics, Manufacturing,OpenDFM, EDA Standards, Semiconductor Manufacturability,
CITATION
C. Rodgers, "OpenDFM Bridging the Gap Between DRC and DFM", IEEE Design & Test of Computers, vol.29, no. 6, pp. 84-90, Dec. 2012, doi:10.1109/MDT.2012.2210380
34 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool