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Issue No.05 - Oct. (2012 vol.29)
pp: 8-17
John P. Keane , University of Minnesota , Minneapolis, MN, USA
ABSTRACT
Editor's notes:
INDEX TERMS
Stress analysis, Aging, Frequency measurement, Temperature measurement, Sensor phenomena and characterization, Odometers, Path planning, Silicon odometer, Reliability, Variations, Bias Temperature Instability, Sensors, Critical Paths
CITATION
John P. Keane, "Process and Reliability Sensors for Nanoscale CMOS", IEEE Design & Test of Computers, vol.29, no. 5, pp. 8-17, Oct. 2012, doi:10.1109/MDT.2012.2211561
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