Process and Reliability Sensors for Nanoscale CMOS

Sachin S. Sapatnekar; John P. Keane; Qunzeng Liu; Chris H. Kim

doi:10.1109/MDT.2012.2211561

Design&Test
2012
Issue No. 5 - Oct.
Abstract - Process and Reliability Sensors for Nanoscale CMOS

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/EndNote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Sachin S. Sapatnekar Articles by Qunzeng Liu Articles by Chris H. Kim Articles by John P. Keane

Process and Reliability Sensors for Nanoscale CMOS

Oct. 2012 (vol. 29 no. 5)

pp. 8-17

	ASCII Text	x
	Sachin S. Sapatnekar, Qunzeng Liu, Chris H. Kim, John P. Keane, "Process and Reliability Sensors for Nanoscale CMOS," IEEE Design & Test of Computers, vol. 29, no. 5, pp. 8-17, Oct., 2012.

	BibTex	x
	@article{ 10.1109/MDT.2012.2211561, author = {Sachin S. Sapatnekar and Qunzeng Liu and Chris H. Kim and John P. Keane}, title = {Process and Reliability Sensors for Nanoscale CMOS}, journal ={IEEE Design & Test of Computers}, volume = {29}, number = {5}, issn = {0740-7475}, year = {2012}, pages = {8-17}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2012.2211561}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design & Test of Computers TI - Process and Reliability Sensors for Nanoscale CMOS IS - 5 SN - 0740-7475 SP8 EP17 EPD - 8-17 A1 - Sachin S. Sapatnekar, A1 - Qunzeng Liu, A1 - Chris H. Kim, A1 - John P. Keane, PY - 2012 KW - Stress analysis KW - Aging KW - Frequency measurement KW - Temperature measurement KW - Sensor phenomena and characterization KW - Odometers KW - Path planning KW - Silicon odometer KW - Reliability KW - Variations KW - Bias Temperature Instability KW - Sensors KW - Critical Paths VL - 29 JA - IEEE Design & Test of Computers ER -

Sachin S. Sapatnekar, University of Minnesota, Minneapolis,

Qunzeng Liu, University of Minnesota, Minneapolis, MN, USA

Chris H. Kim, University of Minnesota, Minneapolis, MN, USA

John P. Keane, University of Minnesota , Minneapolis, MN, USA

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2012.2211561

Editor's notes:

Index Terms:

Stress analysis,Aging,Frequency measurement,Temperature measurement,Sensor phenomena and characterization,Odometers,Path planning,Silicon odometer,Reliability,Variations,Bias Temperature Instability,Sensors,Critical Paths

Citation:

Sachin S. Sapatnekar, Qunzeng Liu, Chris H. Kim, John P. Keane, "Process and Reliability Sensors for Nanoscale CMOS," IEEE Design & Test of Computers, vol. 29, no. 5, pp. 8-17, Oct. 2012, doi:10.1109/MDT.2012.2211561

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.