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Process and Reliability Sensors for Nanoscale CMOS
Oct. 2012 (vol. 29 no. 5)
pp. 8-17
Sachin S. Sapatnekar, University of Minnesota, Minneapolis,
Qunzeng Liu, University of Minnesota, Minneapolis, MN, USA
Chris H. Kim, University of Minnesota, Minneapolis, MN, USA
John P. Keane, University of Minnesota , Minneapolis, MN, USA
Editor's notes:
Index Terms:
Stress analysis,Aging,Frequency measurement,Temperature measurement,Sensor phenomena and characterization,Odometers,Path planning,Silicon odometer,Reliability,Variations,Bias Temperature Instability,Sensors,Critical Paths
Citation:
Sachin S. Sapatnekar, Qunzeng Liu, Chris H. Kim, John P. Keane, "Process and Reliability Sensors for Nanoscale CMOS," IEEE Design & Test of Computers, vol. 29, no. 5, pp. 8-17, Oct. 2012, doi:10.1109/MDT.2012.2211561
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