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Issue No.05 - Oct. (2012 vol.29)
pp: 72-80
Maikel van Beurden , NXP Semiconductors, The Netherlands
Hamidreza Hashempour , NXP Semiconductors, The Netherlands
Camelia Hora , NXP Semiconductors, The Netherlands
Jos Dohmen , NXP Semiconductors, The Netherlands
Bratislav Tasic , NXP Semiconductors, The Netherlands
Bram Kruseman , High-Tech Campus 46, NXP Semiconductors, The Netherlands
Yizi Xing , NXP Semiconductors, The Netherlands
ABSTRACT
Editor's notes:
INDEX TERMS
Circuit faults, Integrated circuit modeling, US Department of Transportation, Bridge circuits, Analytical models, Computational modeling
CITATION
Maikel van Beurden, Hamidreza Hashempour, Camelia Hora, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Yizi Xing, "Defect Oriented Testing for Analog/Mixed-Signal Designs", IEEE Design & Test of Computers, vol.29, no. 5, pp. 72-80, Oct. 2012, doi:10.1109/MDT.2012.2210852
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