This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Defect Oriented Testing for Analog/Mixed-Signal Designs
Oct. 2012 (vol. 29 no. 5)
pp. 72-80
Maikel van Beurden, NXP Semiconductors, The Netherlands
Hamidreza Hashempour, NXP Semiconductors, The Netherlands
Camelia Hora, NXP Semiconductors, The Netherlands
Jos Dohmen, NXP Semiconductors, The Netherlands
Bratislav Tasic, NXP Semiconductors, The Netherlands
Bram Kruseman, High-Tech Campus 46, NXP Semiconductors, The Netherlands
Yizi Xing, NXP Semiconductors, The Netherlands
Editor's notes:
Index Terms:
Circuit faults,Integrated circuit modeling,US Department of Transportation,Bridge circuits,Analytical models,Computational modeling
Citation:
Maikel van Beurden, Hamidreza Hashempour, Camelia Hora, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Yizi Xing, "Defect Oriented Testing for Analog/Mixed-Signal Designs," IEEE Design & Test of Computers, vol. 29, no. 5, pp. 72-80, Oct. 2012, doi:10.1109/MDT.2012.2210852
Usage of this product signifies your acceptance of the Terms of Use.