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Issue No.05 - Oct. (2012 vol.29)
pp: 72-80
Yizi Xing , NXP Semiconductors, The Netherlands
ABSTRACT
Editor's notes:
INDEX TERMS
Circuit faults, Integrated circuit modeling, US Department of Transportation, Bridge circuits, Analytical models, Computational modeling
CITATION
Yizi Xing, "Defect Oriented Testing for Analog/Mixed-Signal Designs", IEEE Design & Test of Computers, vol.29, no. 5, pp. 72-80, Oct. 2012, doi:10.1109/MDT.2012.2210852
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