Maikel van Beurden, Hamidreza Hashempour, Camelia Hora, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Yizi Xing, "Defect Oriented Testing for Analog/Mixed-Signal Designs," IEEE Design & Test of Computers, vol. 29, no. 5, pp. 72-80, Oct., 2012.

@article{ 10.1109/MDT.2012.2210852,
author = {Maikel van Beurden and Hamidreza Hashempour and Camelia Hora and Jos Dohmen and Bratislav Tasic and Bram Kruseman and Yizi Xing},
title = {Defect Oriented Testing for Analog/Mixed-Signal Designs},
journal ={IEEE Design & Test of Computers},
volume = {29},
number = {5},
issn = {0740-7475},
year = {2012},
pages = {72-80},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2012.2210852},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - MGZN
JO - IEEE Design & Test of Computers
TI - Defect Oriented Testing for Analog/Mixed-Signal Designs
IS - 5
SN - 0740-7475
SP72
EP80
EPD - 72-80
A1 - Maikel van Beurden,
A1 - Hamidreza Hashempour,
A1 - Camelia Hora,
A1 - Jos Dohmen,
A1 - Bratislav Tasic,
A1 - Bram Kruseman,
A1 - Yizi Xing,
PY - 2012
KW - Circuit faults
KW - Integrated circuit modeling
KW - US Department of Transportation
KW - Bridge circuits
KW - Analytical models
KW - Computational modeling
VL - 29
JA - IEEE Design & Test of Computers
ER -