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Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost
Oct. 2012 (vol. 29 no. 5)
pp. 63-71
Daisuke Watanabe, ADVANTEST Corporation,
Masayuki Kawabata, ADVANTEST Corporation,
Tasuku Fujibe, ADVANTEST Corporation,
Kiyotaka Ichiyama, ADVANTEST Corporation,
Masahiro Ishida, ADVANTEST Corporation,
Editor's notes:
Index Terms:
Testing,Jitter,Real time systems,Timing,Threshold voltage,Receivers,Noise measurement,jitter tolerance,multi-level signal interface,multi-level signal testing,voltage noise tolerance
Citation:
Daisuke Watanabe, Masayuki Kawabata, Tasuku Fujibe, Kiyotaka Ichiyama, Masahiro Ishida, "Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost," IEEE Design & Test of Computers, vol. 29, no. 5, pp. 63-71, Oct. 2012, doi:10.1109/MDT.2012.2210382
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