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Issue No.05 - Oct. (2012 vol.29)
pp: 18-26
Vijay Reddy , Texas Instruments, Dallas, TX, USA
ABSTRACT
Editors' notes:
INDEX TERMS
Degradation, Aging, Reliability, Sensors, Delays, System-on-a-chip, Circuit testing, TDC, variations, relibility, BTI, aging sensor, on-chip test strucutrue, circuit delay, circuit activity, workload, asymetric aging, RO
CITATION
Vijay Reddy, "Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors", IEEE Design & Test of Computers, vol.29, no. 5, pp. 18-26, Oct. 2012, doi:10.1109/MDT.2012.2210381
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