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Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors
Oct. 2012 (vol. 29 no. 5)
pp. 18-26
Venkatesh Srinivasan, Texas Instruments, Dallas, TX, USA
Yu Cao, Department of Electrical Engineering, Arizona State University, Tempe, AZ, USA
Srikanth Krishnan, Texas Instruments, Dallas, TX, USA
Min Chen, Texas Instruments, Dallas,
Vijay Reddy, Texas Instruments, Dallas, TX, USA
Editors' notes:
Index Terms:
Degradation,Aging,Reliability,Sensors,Delays,System-on-a-chip,Circuit testing,TDC,variations,relibility,BTI,aging sensor,on-chip test strucutrue,circuit delay,circuit activity,workload,asymetric aging,RO
Citation:
Venkatesh Srinivasan, Yu Cao, Srikanth Krishnan, Min Chen, Vijay Reddy, "Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors," IEEE Design & Test of Computers, vol. 29, no. 5, pp. 18-26, Oct. 2012, doi:10.1109/MDT.2012.2210381
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