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Index Terms:
Book reviews, System testing, Testing, Fault diagnosis, Failure analysis, Circuit testing
Citation:
"Test and Diagnosis for Small-Delay Defects (Tehranipoor, M. et al; 2011) [Book review]," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 65-67, Jan. 2012, doi:10.1109/MDT.2011.2179339
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