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Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures
January 2012 (vol. 29 no. 1)
pp. 48-58
ASCII Text
x 
 
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee, "Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 48-58, January, 2012.
 
 
BibTex
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@article{ 10.1109/MDT.2011.2179348,
author = {Shyam Kumar Devarakond and Shreyas Sen and Soumendu Bhattacharya and Abhijit Chatterjee},
title = {Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures},
journal ={IEEE Design & Test of Computers},
volume = {29},
number = {1},
issn = {0740-7475},
year = {2012},
pages = {48-58},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.2179348},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures
IS - 1
SN - 0740-7475
SP48
EP58
EPD - 48-58
A1 - Shyam Kumar Devarakond,
A1 - Shreyas Sen,
A1 - Soumendu Bhattacharya,
A1 - Abhijit Chatterjee,
PY - 2012
KW - Semiconductor device modeling
KW - Radio frequency
KW - Concurrent computing
KW - Integrated circuit modeling
KW - Computational modeling
KW - Process control
VL - 29
JA - IEEE Design & Test of Computers
ER -
 
Shyam Kumar Devarakond, Georgia Institute of Technology , Atlanta,
Shreyas Sen, Intel Circuit Research Lab , Hillsboro,
Soumendu Bhattacharya, Texas Instruments, Dallas,
Abhijit Chatterjee, Georgia Institute of Technology, Atlanta,
Editor's note:
Index Terms:
Semiconductor device modeling, Radio frequency, Concurrent computing, Integrated circuit modeling, Computational modeling, Process control
Citation:
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee, "Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 48-58, Jan. 2012, doi:10.1109/MDT.2011.2179348
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