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Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures
January 2012 (vol. 29 no. 1)
pp. 48-58
Shyam Kumar Devarakond, Georgia Institute of Technology , Atlanta,
Shreyas Sen, Intel Circuit Research Lab , Hillsboro,
Soumendu Bhattacharya, Texas Instruments, Dallas,
Abhijit Chatterjee, Georgia Institute of Technology, Atlanta,
Editor's note:
Index Terms:
Semiconductor device modeling, Radio frequency, Concurrent computing, Integrated circuit modeling, Computational modeling, Process control
Citation:
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee, "Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 48-58, Jan. 2012, doi:10.1109/MDT.2011.2179348
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