The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.01 - January (2012 vol.29)
pp: 48-58
Shyam Kumar Devarakond , Georgia Institute of Technology , Atlanta,
Shreyas Sen , Intel Circuit Research Lab , Hillsboro,
Soumendu Bhattacharya , Texas Instruments, Dallas,
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta,
ABSTRACT
Editor's note:
INDEX TERMS
Semiconductor device modeling, Radio frequency, Concurrent computing, Integrated circuit modeling, Computational modeling, Process control
CITATION
Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee, "Concurrent Device/Specification Cause -- Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures", IEEE Design & Test of Computers, vol.29, no. 1, pp. 48-58, January 2012, doi:10.1109/MDT.2011.2179348
50 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool