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Issue No.01 - January (2012 vol.29)
pp: 36-47
Ronald DeShawn Blanton , Advanced Chip Testing Laboratory, Carnegie Mellon University,
Wing Chiu Tam , Advanced Chip Testing Laboratory, Carnegie Mellon University,
Xiaochun Yu , Advanced Chip Testing Laboratory, Carnegie Mellon University,
Jeffrey E. Nelson , Advanced Chip Testing Laboratory, Carnegie Mellon University,
Osei Poku , Advanced Chip Testing Laboratory, Carnegie Mellon University,
ABSTRACT
Editor's note:
INDEX TERMS
Integrated circuits, Accuracy, Failure analysis, Arrays, Manufacturing processes, Learning systems, System testing
CITATION
Ronald DeShawn Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku, "Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations", IEEE Design & Test of Computers, vol.29, no. 1, pp. 36-47, January 2012, doi:10.1109/MDT.2011.2178587
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