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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations
January 2012 (vol. 29 no. 1)
pp. 36-47
Ronald DeShawn Blanton, Advanced Chip Testing Laboratory, Carnegie Mellon University,
Wing Chiu Tam, Advanced Chip Testing Laboratory, Carnegie Mellon University,
Xiaochun Yu, Advanced Chip Testing Laboratory, Carnegie Mellon University,
Jeffrey E. Nelson, Advanced Chip Testing Laboratory, Carnegie Mellon University,
Osei Poku, Advanced Chip Testing Laboratory, Carnegie Mellon University,
Editor's note:
Index Terms:
Integrated circuits, Accuracy, Failure analysis, Arrays, Manufacturing processes, Learning systems, System testing
Citation:
Ronald DeShawn Blanton, Wing Chiu Tam, Xiaochun Yu, Jeffrey E. Nelson, Osei Poku, "Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 36-47, Jan. 2012, doi:10.1109/MDT.2011.2178587
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