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Applying the Model-View-Controller Paradigm to Adaptive Test
January 2012 (vol. 29 no. 1)
pp. 28-35
Nathan Kupp, Yale University,
Yiorgos Makris, Electrical Engineering Department, The University of Texas at Dallas, Richardson, TX, USA
Editor's note:
Index Terms:
Adaptation models, Adaptive systems, Semiconductor device modeling, Data models, Testing, Analytical models
Citation:
Nathan Kupp, Yiorgos Makris, "Applying the Model-View-Controller Paradigm to Adaptive Test," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 28-35, Jan. 2012, doi:10.1109/MDT.2011.2179370
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