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Issue No.01 - January (2012 vol.29)
pp: 28-35
Nathan Kupp , Yale University,
ABSTRACT
Editor's note:
INDEX TERMS
Adaptation models, Adaptive systems, Semiconductor device modeling, Data models, Testing, Analytical models
CITATION
Nathan Kupp, "Applying the Model-View-Controller Paradigm to Adaptive Test", IEEE Design & Test of Computers, vol.29, no. 1, pp. 28-35, January 2012, doi:10.1109/MDT.2011.2179370
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