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Applying the Model-View-Controller Paradigm to Adaptive Test
January 2012 (vol. 29 no. 1)
pp. 28-35
ASCII Text
x 
 
Nathan Kupp, Yiorgos Makris, "Applying the Model-View-Controller Paradigm to Adaptive Test," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 28-35, January, 2012.
 
 
BibTex
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@article{ 10.1109/MDT.2011.2179370,
author = {Nathan Kupp and Yiorgos Makris},
title = {Applying the Model-View-Controller Paradigm to Adaptive Test},
journal ={IEEE Design & Test of Computers},
volume = {29},
number = {1},
issn = {0740-7475},
year = {2012},
pages = {28-35},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.2179370},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Applying the Model-View-Controller Paradigm to Adaptive Test
IS - 1
SN - 0740-7475
SP28
EP35
EPD - 28-35
A1 - Nathan Kupp,
A1 - Yiorgos Makris,
PY - 2012
KW - Adaptation models
KW - Adaptive systems
KW - Semiconductor device modeling
KW - Data models
KW - Testing
KW - Analytical models
VL - 29
JA - IEEE Design & Test of Computers
ER -
 
Nathan Kupp, Yale University,
Yiorgos Makris, Electrical Engineering Department, The University of Texas at Dallas, Richardson, TX, USA
Editor's note:
Index Terms:
Adaptation models, Adaptive systems, Semiconductor device modeling, Data models, Testing, Analytical models
Citation:
Nathan Kupp, Yiorgos Makris, "Applying the Model-View-Controller Paradigm to Adaptive Test," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 28-35, Jan. 2012, doi:10.1109/MDT.2011.2179370
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