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An Industrial Study of System-Level Test
January 2012 (vol. 29 no. 1)
pp. 19-27
Sounil Biswas, Nvidia, Santa Clara,
Bruce Cory, Nvidia, Santa Clara,
Editor's note:
Index Terms:
Integrated circuits, Semiconductor device measurement, Wafer scale integration, Correlation, Graphics, Frequency measurement, Ring oscillators, System-level design
Citation:
Sounil Biswas, Bruce Cory, "An Industrial Study of System-Level Test," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 19-27, Jan. 2012, doi:10.1109/MDT.2011.2178387
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