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Issue No.01 - January (2012 vol.29)
pp: 19-27
Sounil Biswas , Nvidia, Santa Clara,
Bruce Cory , Nvidia, Santa Clara,
ABSTRACT
Editor's note:
INDEX TERMS
Integrated circuits, Semiconductor device measurement, Wafer scale integration, Correlation, Graphics, Frequency measurement, Ring oscillators, System-level design
CITATION
Sounil Biswas, Bruce Cory, "An Industrial Study of System-Level Test", IEEE Design & Test of Computers, vol.29, no. 1, pp. 19-27, January 2012, doi:10.1109/MDT.2011.2178387
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