Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

Brady Benware; Thomas Herrmann; Chris Schuermyer; Manish Sharma

doi:10.1109/MDT.2011.2178386

Design&Test
2012
Issue No. 1 - January
Abstract - Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

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Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results

January 2012 (vol. 29 no. 1)

pp. 8-18

	ASCII Text	x
	Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann, "Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 8-18, January, 2012.

	BibTex	x
	@article{ 10.1109/MDT.2011.2178386, author = {Brady Benware and Chris Schuermyer and Manish Sharma and Thomas Herrmann}, title = {Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results}, journal ={IEEE Design & Test of Computers}, volume = {29}, number = {1}, issn = {0740-7475}, year = {2012}, pages = {8-18}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.2178386}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design & Test of Computers TI - Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results IS - 1 SN - 0740-7475 SP8 EP18 EPD - 8-18 A1 - Brady Benware, A1 - Chris Schuermyer, A1 - Manish Sharma, A1 - Thomas Herrmann, PY - 2012 KW - Random variables KW - Feature extraction KW - Bayesian methods KW - Learning systems KW - Fault diagnosis KW - Machine learning VL - 29 JA - IEEE Design & Test of Computers ER -

Brady Benware, Mentor Graphics Corp., Wilsonville, OR, USA

Chris Schuermyer, Mentor Graphics Corp., Wilsonville, OR, USA

Manish Sharma, Mentor Graphics Corp., Wilsonville, OR, USA

Thomas Herrmann, GLOBALFOUNDRIES, Dresden, Germany

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.2178386

Editor's note:

Index Terms:

Random variables, Feature extraction, Bayesian methods, Learning systems, Fault diagnosis, Machine learning

Citation:

Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann, "Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 8-18, Jan. 2012, doi:10.1109/MDT.2011.2178386

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