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Issue No.01 - January (2012 vol.29)
pp: 8-18
Brady Benware , Mentor Graphics Corp., Wilsonville, OR, USA
Chris Schuermyer , Mentor Graphics Corp., Wilsonville, OR, USA
Manish Sharma , Mentor Graphics Corp., Wilsonville, OR, USA
Thomas Herrmann , GLOBALFOUNDRIES, Dresden, Germany
ABSTRACT
Editor's note:
INDEX TERMS
Random variables, Feature extraction, Bayesian methods, Learning systems, Fault diagnosis, Machine learning
CITATION
Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann, "Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results", IEEE Design & Test of Computers, vol.29, no. 1, pp. 8-18, January 2012, doi:10.1109/MDT.2011.2178386
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