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Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results
January 2012 (vol. 29 no. 1)
pp. 8-18
Brady Benware, Mentor Graphics Corp., Wilsonville, OR, USA
Chris Schuermyer, Mentor Graphics Corp., Wilsonville, OR, USA
Manish Sharma, Mentor Graphics Corp., Wilsonville, OR, USA
Thomas Herrmann, GLOBALFOUNDRIES, Dresden, Germany
Editor's note:
Index Terms:
Random variables, Feature extraction, Bayesian methods, Learning systems, Fault diagnosis, Machine learning
Citation:
Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann, "Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 8-18, Jan. 2012, doi:10.1109/MDT.2011.2178386
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