Issue No.01 - January (2012 vol.29)
Anne Gattiker , IBM,
The articles in this special section are devoted to the topic yield learning processes and methods.
Special issues and sections, Yield estimation, Learning systems, Machine learning, Failure analysis, Fault diagnosis
Anne Gattiker, "Guest Editors' Introduction: Yield Learning Processes and Methods", IEEE Design & Test of Computers, vol.29, no. 1, pp. 6-7, January 2012, doi:10.1109/MDT.2011.2180958