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Issue No.01 - January (2012 vol.29)
pp: 6-7
Phil Nigh , Microelectronics Division, IBM Server & Technology Group,
ABSTRACT
The articles in this special section are devoted to the topic yield learning processes and methods.
INDEX TERMS
Special issues and sections, Yield estimation, Learning systems, Machine learning, Failure analysis, Fault diagnosis
CITATION
Anne Gattiker, Phil Nigh, "Guest Editors' Introduction: Yield Learning Processes and Methods", IEEE Design & Test of Computers, vol.29, no. 1, pp. 6-7, January 2012, doi:10.1109/MDT.2011.2180958
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