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January 2012 (vol. 29 no. 1)
pp. 6-7
Phil Nigh, Microelectronics Division, IBM Server & Technology Group,
The articles in this special section are devoted to the topic yield learning processes and methods.
Index Terms:
Special issues and sections, Yield estimation, Learning systems, Machine learning, Failure analysis, Fault diagnosis
Citation:
Anne Gattiker, Phil Nigh, "Guest Editors' Introduction: Yield Learning Processes and Methods," IEEE Design & Test of Computers, vol. 29, no. 1, pp. 6-7, Jan. 2012, doi:10.1109/MDT.2011.2180958
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