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Conference Reports
Nov.-Dec. 2011 (vol. 28 no. 6)
pp. 94-95
| ASCII Text | x | ||
| "Conference Reports," IEEE Design & Test of Computers, vol. 28, no. 6, pp. 94-95, Nov.-Dec., 2011. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2011.124, author = {}, title = {Conference Reports}, journal ={IEEE Design & Test of Computers}, volume = {28}, number = {6}, issn = {0740-7475}, year = {2011}, pages = {94-95}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.124}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Conference Reports IS - 6 SN - 0740-7475 SP94 EP95 EPD - 94-95 PY - 2011 KW - design and test KW - 3D-Test KW - EWDTS VL - 28 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.124
This column describes the IEEE 2011 East-West Design & Test International Symposium and the 3D-Test Workshop at the 2011 International Test Conference.
Index Terms:
design and test, 3D-Test, EWDTS
Citation:
"Conference Reports," IEEE Design & Test of Computers, vol. 28, no. 6, pp. 94-95, Nov.-Dec. 2011, doi:10.1109/MDT.2011.124
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