This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Replacing Error Vector Magnitude Test with RF and Analog BISTs
Nov.-Dec. 2011 (vol. 28 no. 6)
pp. 66-75
Dallas L. Webster, Texas Instruments
Rick Hudgens, Texas Instruments
Donald Lie, Texas Tech University

RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.

1. R.B. Staszewski et al., "A 24mm2 Quad-Band Single-Chip GSM Radio with Transmitter Calibration in 90nm Digital CMOS," Proc. IEEE Int'l Solid-State Circuits Conf. (ISSCC 08), IEEE CS Press, 2008, pp. 208-607.
2. J.J. Dabrowski and R.M. Ramzan, "Built-in Loopback Test for IC RF Transceivers," IEEE Trans. VLSI Systems, vol. 18, no. 6, 2010, pp. 933-946.
3. G. Srinivasan, F. Taenzler, and A. Chatterjee, "Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers," IEEE Design and Test, vol. 25, no. 2, 2008, pp. 150-159.
4. A. Valdes-Garcia, J. Silva-Martinez, and E. Sanchez-Sinencio, "On-Chip Testing Techniques for RF Wireless Transceivers," IEEE Design and Test, vol. 23, no. 4, 2006, pp. 268-277.
5. L. Jin et al., "Testing of Precision DACs Using Low-Resolution ADCs with Dithering," Proc. IEEE Int'l Test Conf. (ITC 06), IEEE CS Press, 2006, doi 10.1109/TEST.2006.297628.
6. K. Muhammad, R.B. Staszewski, and D. Leipold, "Digital RF Processing: Toward Low-Cost Reconfigurable Radios," IEEE Comm., vol. 43, no. 8, 2005, pp. 105-111.
7. O. Eliezer et al., "Built-in Self Testing of a DRP-Based GSM Transmitter," Proc. IEEE RFIC Symp., IEEE Press, 2007, pp. 339-342.
8. J. Craninckx and M. Steyaert, "Low-Noise Voltage Controlled Oscillators Using Enhanced LC-Tanks," IEEE Trans. Circuits and Systems II, vol. 42, no. 12, 1995, pp. 794-904.
9. D. Webster et al., "A Novel RF Phase Error Built-in-Self-Test for GSM," Proc. 9th Int'l Conf. Solid-State and Integrated-Circuit Technology (ISCICT 08), IEEE Press, 2008, pp. 2075-2078.
10. D. Webster et al., "Novel BIST Methods for Parametric Test in Wireless Transceivers," Proc. IEEE 10th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, IEEE Press, 2010, pp. 112-115.
11. A. Georgiadis, "Gain, Phase Imbalance, and Phase Noise Effects on Error Vector Magnitude," IEEE Trans. Vehicular Technology, vol. 53, no. 2, 2004, pp. 443-449.
12. S. Sunter and A. Roy, "On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz," IEEE Design & Test, vol. 21, no. 4, 2004, pp. 314-321.
13. K. Dufrene, Z. Boos, and R. Weigel, "Digital Adaptive IIP2 Calibration Scheme for CMOS Downconversion Mixers," IEEE J. Solid-State Circuits, vol. 43, no. 11, 2008, pp. 2434-2445.
14. H.-G. Stratigopoulos, S. Mir, and A. Bounceur, "Evaluation of Analog/RF Test Measurements at the Design Stage," IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems," vol. 28, no. 4, 2009, pp. 582-590.

Index Terms:
design and test, BIST, CMOS integrated circuits, EVM, production test, RF-BIST, RF-SoC, self-calibration, self-testing, SoC, wireless LAN
Citation:
Dallas L. Webster, Rick Hudgens, Donald Lie, "Replacing Error Vector Magnitude Test with RF and Analog BISTs," IEEE Design & Test of Computers, vol. 28, no. 6, pp. 66-75, Nov.-Dec. 2011, doi:10.1109/MDT.2011.1
Usage of this product signifies your acceptance of the Terms of Use.