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Replacing Error Vector Magnitude Test with RF and Analog BISTs
Nov.-Dec. 2011 (vol. 28 no. 6)
pp. 66-75
Dallas L. Webster, Texas Instruments
Rick Hudgens, Texas Instruments
Donald Lie, Texas Tech University

RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.

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Index Terms:
design and test, BIST, CMOS integrated circuits, EVM, production test, RF-BIST, RF-SoC, self-calibration, self-testing, SoC, wireless LAN
Dallas L. Webster, Rick Hudgens, Donald Lie, "Replacing Error Vector Magnitude Test with RF and Analog BISTs," IEEE Design & Test of Computers, vol. 28, no. 6, pp. 66-75, Nov.-Dec. 2011, doi:10.1109/MDT.2011.1
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