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Issue No.06 - Nov.-Dec. (2011 vol.28)
pp: 66-75
Dallas L. Webster , Texas Instruments
Rick Hudgens , Texas Instruments
Donald Lie , Texas Tech University
<p>RF and analog BIST techniques are capable of replacing the traditional error vector magnitude (EVM) test used in production. In a case study, four BISTs detected actual production faults in a commercial, highly integrated WLAN device. In combination with traditional digital testing, the BISTs caught an impressive 100% of EVM failures during production of over a million devices, which presents significant opportunities for both cost and time savings.</p>
design and test, BIST, CMOS integrated circuits, EVM, production test, RF-BIST, RF-SoC, self-calibration, self-testing, SoC, wireless LAN
Dallas L. Webster, Rick Hudgens, Donald Lie, "Replacing Error Vector Magnitude Test with RF and Analog BISTs", IEEE Design & Test of Computers, vol.28, no. 6, pp. 66-75, Nov.-Dec. 2011, doi:10.1109/MDT.2011.1
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