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Issue No.06 - Nov.-Dec. (2011 vol.28)

pp: 41-49

Peter Maxwell , Aptina

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.118

ABSTRACT

<p>This article describes the development of adaptive testing in response to the ever-growing need to dynamically and cost-effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of its use. Finally, challenges for future development are discussed.</p>

INDEX TERMS

design and test, variability, statistical data analysis, test flow, real-time analysis

CITATION

Peter Maxwell, "Adaptive Testing: Dealing with Process Variability",

*IEEE Design & Test of Computers*, vol.28, no. 6, pp. 41-49, Nov.-Dec. 2011, doi:10.1109/MDT.2011.118REFERENCES

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