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| Peter Maxwell, "Adaptive Testing: Dealing with Process Variability," IEEE Design & Test of Computers, vol. 28, no. 6, pp. 41-49, Nov.-Dec., 2011. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2011.118, author = {Peter Maxwell}, title = {Adaptive Testing: Dealing with Process Variability}, journal ={IEEE Design & Test of Computers}, volume = {28}, number = {6}, issn = {0740-7475}, year = {2011}, pages = {41-49}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.118}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Adaptive Testing: Dealing with Process Variability IS - 6 SN - 0740-7475 SP41 EP49 EPD - 41-49 A1 - Peter Maxwell, PY - 2011 KW - design and test KW - variability KW - statistical data analysis KW - test flow KW - real-time analysis VL - 28 JA - IEEE Design & Test of Computers ER - | |||
This article describes the development of adaptive testing in response to the ever-growing need to dynamically and cost-effectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of its use. Finally, challenges for future development are discussed.
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