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Peter Maxwell, "Adaptive Testing: Dealing with Process Variability," IEEE Design & Test of Computers, vol. 28, no. 6, pp. 4149, Nov.Dec., 2011.  
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@article{ 10.1109/MDT.2011.118, author = {Peter Maxwell}, title = {Adaptive Testing: Dealing with Process Variability}, journal ={IEEE Design & Test of Computers}, volume = {28}, number = {6}, issn = {07407475}, year = {2011}, pages = {4149}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.118}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }  
RefWorks Procite/RefMan/Endnote  x  
TY  MGZN JO  IEEE Design & Test of Computers TI  Adaptive Testing: Dealing with Process Variability IS  6 SN  07407475 SP41 EP49 EPD  4149 A1  Peter Maxwell, PY  2011 KW  design and test KW  variability KW  statistical data analysis KW  test flow KW  realtime analysis VL  28 JA  IEEE Design & Test of Computers ER   
This article describes the development of adaptive testing in response to the evergrowing need to dynamically and costeffectively tailor IC testing to discriminately manage manufacturing process variations. Various degrees of adoption are presented, together with benefits and examples of its use. Finally, challenges for future development are discussed.
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