|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
Test Technology TC Newsletter
September/October 2011 (vol. 28 no. 5)
pp. 114-115
| ASCII Text | x | ||
| "Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 28, no. 5, pp. 114-115, September/October, 2011. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2011.116, author = {}, title = {Test Technology TC Newsletter}, journal ={IEEE Design & Test of Computers}, volume = {28}, number = {5}, issn = {0740-7475}, year = {2011}, pages = {114-115}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.116}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Test Technology TC Newsletter IS - 5 SN - 0740-7475 SP114 EP115 EPD - 114-115 PY - 2011 KW - design and test KW - TTTC KW - test technology KW - ITC KW - ETS KW - ATS KW - DFT KW - IMS3TW VL - 28 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.116
This newsletter provides information on past and upcoming events related to the IEEE Computer Society's Test Technology Technical Council and the test community.
Index Terms:
design and test, TTTC, test technology, ITC, ETS, ATS, DFT, IMS3TW
Citation:
"Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 28, no. 5, pp. 114-115, Sept.-Oct. 2011, doi:10.1109/MDT.2011.116
Usage of this product signifies your acceptance of the Terms of Use.