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Issue No.05 - September/October (2011 vol.28)
pp: 95
Published by the IEEE Computer Society
ABSTRACT
<p>Conference Reports features the European Test Symposium.</p>
ETS 2011: European Test Symposium
Erik Larsson, Linköping University
Erik Larsson, Linköping University
The European Test Symposium (ETS) is the largest event in Europe devoted entirely to presenting and discussing trends, emerging results, hot topics, and practical applications in the area of electronic-based circuit and system testing. The 16th ETS was held in Trondheim, Norway, on 23–27 May 2011. ETS 11 was organized by the Norwegian University of Science and Technology, and it was sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.
The symposium's technical program consisted of two plenary keynote addresses. Shekhar Borkar (Intel) presented "The Truths and Myths of Embedded Computing," and Frank Berntsen (Nordic Semiconductor) presented "From Custom Design to High Volume Design and Manufacture—Shift in Major Validation and Test Challenges."
The program furthermore included 42 technical paper presentations, 14 vendor presentations, four embedded tutorials, three poster sessions with 18 poster papers, three panels, a special session featuring the TTTC Best Doctoral Thesis semifinal contest and student work-in-progress, and four demo tables. Einar Aas (NTNU) was General Chair and Erik Larsson was Program Chair.
Prior to ETS, Paolo Prinetto (Politecnico di Torino) and Hans-Joachim Wunderlich (University of Stuttgart) helped organize a Test Spring School held on 20–23 May. Following the symposium, Peter Harrod (ARM) helped organize three workshops: "Dependability Issues in Deep-submicron Technologies [DDT]," "IEEE International Workshop on Processor Verification, Test and Debug [IWPVTD]," and "4th IEEE International Workshop on Impact of Low-Power Design on Test and Reliability [LPonTR]."
The next European Test Symposium will be held in May 2012 in Annecy, France. For more details, please check http://www.ieee-ets.org/.
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