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Test Technology TC Newsletter
May/June 2011 (vol. 28 no. 3)
pp. 92-93
| ASCII Text | x | ||
| "Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 28, no. 3, pp. 92-93, May/June, 2011. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2011.65, author = {}, title = {Test Technology TC Newsletter}, journal ={IEEE Design & Test of Computers}, volume = {28}, number = {3}, issn = {0740-7475}, year = {2011}, pages = {92-93}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.65}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Test Technology TC Newsletter IS - 3 SN - 0740-7475 SP92 EP93 EPD - 92-93 PY - 2011 KW - DATE 2011 KW - HOST 2011 KW - ITC 2011 KW - LATW 2011 VL - 28 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.65
This month's TTTC newsletter features synopses of past events and of upcoming events.
Index Terms:
DATE 2011, HOST 2011, ITC 2011, LATW 2011
Citation:
"Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 28, no. 3, pp. 92-93, May-June 2011, doi:10.1109/MDT.2011.65
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