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| "Panel Summaries," IEEE Design & Test of Computers, vol. 28, no. 3, pp. 84-85, May/June, 2011. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2011.64, author = {}, title = {Panel Summaries}, journal ={IEEE Design & Test of Computers}, volume = {28}, number = {3}, issn = {0740-7475}, year = {2011}, pages = {84-85}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.64}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Panel Summaries IS - 3 SN - 0740-7475 SP84 EP85 EPD - 84-85 PY - 2011 KW - design and test KW - ATE KW - DFT KW - ITC 2010 KW - ITC panels VL - 28 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.64
Panel Summaries reports on two ITC 2010 panels: "Concurrent Test Supported by DFT Techniques" and "ATE Companies and How Smart Does Our Silicon Need To Be?".
Index Terms:
design and test, ATE, DFT, ITC 2010, ITC panels
Citation:
"Panel Summaries," IEEE Design & Test of Computers, vol. 28, no. 3, pp. 84-85, May-June 2011, doi:10.1109/MDT.2011.64
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