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May/June 2011 (vol. 28 no. 3)
pp. 84-85

Panel Summaries reports on two ITC 2010 panels: "Concurrent Test Supported by DFT Techniques" and "ATE Companies and How Smart Does Our Silicon Need To Be?".

Index Terms:
design and test, ATE, DFT, ITC 2010, ITC panels
Citation:
"Panel Summaries," IEEE Design & Test of Computers, vol. 28, no. 3, pp. 84-85, May-June 2011, doi:10.1109/MDT.2011.64
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