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May/June 2011 (vol. 28 no. 3)
pp. 82-83
ASCII Text
x 
 
"Conference Reports," IEEE Design & Test of Computers, vol. 28, no. 3, pp. 82-83, May/June, 2011.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2011.57,
author = {},
title = {Conference Reports},
journal ={IEEE Design & Test of Computers},
volume = {28},
number = {3},
issn = {0740-7475},
year = {2011},
pages = {82-83},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.57},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - Conference Reports
IS - 3
SN - 0740-7475
SP82
EP83
EPD - 82-83
PY - 2011
KW - design and test
KW - RASDAT
VL - 28
JA - IEEE Design & Test of Computers
ER -
 

Conference Reports features the second IEEE International Workshop on Reliability Aware System Design and Test (RASDAT),which was held in conjunction with the 24th International Conference on VLSI Design.

Index Terms:
design and test, RASDAT
Citation:
"Conference Reports," IEEE Design & Test of Computers, vol. 28, no. 3, pp. 82-83, May-June 2011, doi:10.1109/MDT.2011.57
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