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May/June 2011 (vol. 28 no. 3)
pp. 82-83

Conference Reports features the second IEEE International Workshop on Reliability Aware System Design and Test (RASDAT),which was held in conjunction with the 24th International Conference on VLSI Design.

Index Terms:
design and test, RASDAT
Citation:
"Conference Reports," IEEE Design & Test of Computers, vol. 28, no. 3, pp. 82-83, May-June 2011, doi:10.1109/MDT.2011.57
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