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Embedded Memories: Progress and a Look into the Future
January/February 2011 (vol. 28 no. 1)
pp. 10-13
| ASCII Text | x | ||
| Kiyoo Itoh, "Embedded Memories: Progress and a Look into the Future," IEEE Design & Test of Computers, vol. 28, no. 1, pp. 10-13, January/February, 2011. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2011.14, author = {Kiyoo Itoh}, title = {Embedded Memories: Progress and a Look into the Future}, journal ={IEEE Design & Test of Computers}, volume = {28}, number = {1}, issn = {0740-7475}, year = {2011}, pages = {10-13}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.14}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Embedded Memories: Progress and a Look into the Future IS - 1 SN - 0740-7475 SP10 EP13 EPD - 10-13 A1 - Kiyoo Itoh, PY - 2011 KW - embedded memory KW - DRAM KW - flash memory KW - MRAM KW - SRAM KW - PCM KW - STT-RAM KW - FeRAM VL - 28 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2011.14
Memories are categorized as embedded memories (e-memories) and stand-alone memories. E-memories favor high speed rather than low cost. In addition, they must maintain compatibility with the logic process, because they must be cofabricated on the same chip as the logic. In contrast, stand-alone memories give the first priority to low cost and thus high density rather than high speed. Over the course of such memory development, memory designers have faced several challenges to cope with problems involved in the e-memories. This article discusses those challenges and examines the likely development path they will take.
Index Terms:
embedded memory, DRAM, flash memory, MRAM, SRAM, PCM, STT-RAM, FeRAM
Citation:
Kiyoo Itoh, "Embedded Memories: Progress and a Look into the Future," IEEE Design & Test of Computers, vol. 28, no. 1, pp. 10-13, Jan.-Feb. 2011, doi:10.1109/MDT.2011.14
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