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January/February 2011 (vol. 28 no. 1)
pp. 6-8
Chris H. Kim, University of Minnesota
Leland Chang, IBM T.J. Watson Research Center

This special issue presents seven articles that examine the characteristics, capabilities, and challenges of various embedded memories, especially those designed in emerging technologies. The articles address the intricacies and trade-offs required by designers when faced with scaling and power constraints.

Index Terms:
design and test, embedded memories, PCRAM, SRAM, DRAM, eDRAM, FeRAM, MRAM, STT-RAM
Citation:
Chris H. Kim, Leland Chang, "Nanoscale Memories Pose Unique Challenges," IEEE Design & Test of Computers, vol. 28, no. 1, pp. 6-8, Jan.-Feb. 2011, doi:10.1109/MDT.2011.21
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