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January/February 2011 (vol. 28 no. 1)
pp. 4

This issue of D&T features seven articles on the future landscape of embedded memories. The articles address emerging memories and the unique challenges of nanoscale memory technologies.

Index Terms:
design and test, embedded memory, eDRAM, SRAM, PCRAM, MRAM, STT-RAM, emerging memories
Citation:
"Embedded memory technologies: Present and future," IEEE Design & Test of Computers, vol. 28, no. 1, pp. 4, Jan.-Feb. 2011, doi:10.1109/MDT.2011.15
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