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IEEE Design & Test of Computers
January/February 2011 (vol. 28 no. 1)
ISSN: 0740-7475
Table of Contents
From the EIC
Call for Papers
Toc
Guest Editors' Introduction
Chris H. Kim, University of Minnesota
Leland Chang, IBM T.J. Watson Research Center
pp. 6-8
Perspectives
Future Landscape of Embedded Memories
Darren Anand, IBM, Essex Junction
Kevin Gorman, IBM, Essex Junction
Mark Jacunski, IBM, Essex Junction
Adrian Paparelli, IBM, Essex Junction
pp. 14-21
Shyh-Shyuan Sheu, National Central University Industrial Technology Research Institute, Taoyuan Hsinchu
Kuo-Hsing Cheng, National Central University, Taoyuan
Meng-Fan Chang, National Tsing Hua University, Hsinchu
Pei-Chia Chiang, Industrial Technology Research Institute, Hsinchu
Wen-Pin Lin, Industrial Technology Research Institute, Hsinchu
Heng-Yuan Lee, Industrial Technology Research Institute National Tsing Hua University, Hsinchu Hsinchu
Pang-Shiu Chen, MingShin University of Science & Technology, Hsinchu
Yu-Sheng Chen, Industrial Technology Research Institute National Tsing Hua University, Hsinchu Hsinchu
Frederick T. Chen, Industrial Technology Research Institute, Hsinchu
Ming-Jinn Tsai, Industrial Technology Research Institute, Hsinchu
pp. 64-71
Standards
Stan Krolikoski, Cadence Design Systems
pp. 72-75
The Road Ahead
Andrew B. Kahng, University of California, San Diego
pp. 76-77
Book Reviews
Conference Reports
CEDA Currents
DATC Newsletter
TTTC Newsletter
The Last Byte
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