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| Stephen Kosonocky, "Are you having fun yet?," IEEE Design & Test of Computers, vol. 27, no. 6, pp. 80, November/December, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2010.124, author = {Stephen Kosonocky}, title = {Are you having fun yet?}, journal ={IEEE Design & Test of Computers}, volume = {27}, number = {6}, issn = {0740-7475}, year = {2010}, pages = {80}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.124}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Are you having fun yet? IS - 6 SN - 0740-7475 SP EP EPD - 80 A1 - Stephen Kosonocky, PY - 2010 KW - design and test KW - Moore's law KW - postsilicon repair KW - scaling KW - yield VL - 27 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.124
Gordon Moore observed, 45 years ago, that the number of components in an IC had doubled every year since the IC's invention in 1958 and predicted this trend would continue. IC scaling has fueled the circuit design industry and the global economy by providing increased processing capabilities at lower costs in each successive technology generation. Somewhere between 65 nm and 45 nm, the industry entered the "More than Moore" realm, defined as adding novel device and packaging technologies to each generation to continue the scaling and performance trend.
Index Terms:
design and test, Moore's law, postsilicon repair, scaling, yield
Citation:
Stephen Kosonocky, "Are you having fun yet?," IEEE Design & Test of Computers, vol. 27, no. 6, pp. 80, Nov.-Dec. 2010, doi:10.1109/MDT.2010.124
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