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November/December 2010 (vol. 27 no. 6)
pp. 72-73

This is a review of Power-Aware Testing and Test Strategies for Low Power Devices (Patrick Girard, Nicola Nicolici, and Xiapqing Wen, eds.).

Index Terms:
design and test, literature survey, power-aware testing, low power, test strategies
Citation:
"About the power problem," IEEE Design & Test of Computers, vol. 27, no. 6, pp. 72-73, Nov.-Dec. 2010, doi:10.1109/MDT.2010.122
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