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November/December 2010 (vol. 27 no. 6)
pp. 72-73
ASCII Text
x 
 
"About the power problem," IEEE Design & Test of Computers, vol. 27, no. 6, pp. 72-73, November/December, 2010.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2010.122,
author = {},
title = {About the power problem},
journal ={IEEE Design & Test of Computers},
volume = {27},
number = {6},
issn = {0740-7475},
year = {2010},
pages = {72-73},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.122},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - About the power problem
IS - 6
SN - 0740-7475
SP72
EP73
EPD - 72-73
PY - 2010
KW - design and test
KW - literature survey
KW - power-aware testing
KW - low power
KW - test strategies
VL - 27
JA - IEEE Design & Test of Computers
ER -
 

This is a review of Power-Aware Testing and Test Strategies for Low Power Devices (Patrick Girard, Nicola Nicolici, and Xiapqing Wen, eds.).

Index Terms:
design and test, literature survey, power-aware testing, low power, test strategies
Citation:
"About the power problem," IEEE Design & Test of Computers, vol. 27, no. 6, pp. 72-73, Nov.-Dec. 2010, doi:10.1109/MDT.2010.122
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