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Issue No.06 - November/December (2010 vol.27)
pp: 36-45
Rajiv Joshi , IBM Corporation,
Rouwaida Kanj , IBM, round Rock
Anthony Pelella , IBM Corporation,
Arthur tuminaro , IBM Corporation,
Yuen Chan , IBM Corporation,
ABSTRACT
<p><it>Editor's note:</it></p><p>Statistical approaches for yield estimation and robust design are vital in the current variation-dominated design era. This article presents a mixture importance sampling methodology to enable yield-driven design and extends its application beyond memories to peripheral circuits and logic blocks.</p><p align="right"><it>&#x2014;Rahul Rao, IBM</it></p>
INDEX TERMS
design and test, DFM, memory, logic, yield, test, variation-tolerant designs
CITATION
Rajiv Joshi, Rouwaida Kanj, Anthony Pelella, Arthur tuminaro, Yuen Chan, "The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane", IEEE Design & Test of Computers, vol.27, no. 6, pp. 36-45, November/December 2010, doi:10.1109/MDT.2010.95
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