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| Wu-Hsin Chen, Byunghoo Jung, "Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies," IEEE Design & Test of Computers, vol. 27, no. 6, pp. 18-25, November/December, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2010.138, author = {Wu-Hsin Chen and Byunghoo Jung}, title = {Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies}, journal ={IEEE Design & Test of Computers}, volume = {27}, number = {6}, issn = {0740-7475}, year = {2010}, pages = {18-25}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.138}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies IS - 6 SN - 0740-7475 SP18 EP25 EPD - 18-25 A1 - Wu-Hsin Chen, A1 - Byunghoo Jung, PY - 2010 KW - design and test KW - phase-locked loop KW - self-healing KW - noise control KW - automatic amplitude control KW - digital-feedback control KW - yield improvement VL - 27 JA - IEEE Design & Test of Computers ER - | |||
Despite their inherent self-healing nature, noise (jitter) in phase-locked loops is sensitive to process and environmental variation. This article discusses automatic frequency calibration and amplitude control techniques that rely on a negative feedback loop with a large emphasis on digitally assisted calibration.
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