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Issue No.06 - November/December (2010 vol.27)
pp: 18-25
Wu-Hsin Chen , Purdue University
Byunghoo Jung , Purdue University
ABSTRACT
<p><it>Editor's note:</it></p><p>Despite their inherent self-healing nature, noise (jitter) in phase-locked loops is sensitive to process and environmental variation. This article discusses automatic frequency calibration and amplitude control techniques that rely on a negative feedback loop with a large emphasis on digitally assisted calibration.</p><p align="right"><it>&#x2014;Rahul Rao, IBM</it></p>
INDEX TERMS
design and test, phase-locked loop, self-healing, noise control, automatic amplitude control, digital-feedback control, yield improvement
CITATION
Wu-Hsin Chen, Byunghoo Jung, "Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies", IEEE Design & Test of Computers, vol.27, no. 6, pp. 18-25, November/December 2010, doi:10.1109/MDT.2010.138
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