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Issue No.06 - November/December (2010 vol.27)
pp: 6-17
Shreyas Sen , Georgia Institute of Technology
Aritra Banerjee , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
Ganesh Srinivasan , Texas Instruments
Friedrich Taenzler , Texas Instruments
ABSTRACT
<p><it>Editor's note:</it></p><p>Tuning knobs are becoming common in analog and RF devices for postsilicon calibration for variation tolerance and compensation. This article presents a low-cost, hardware-iterative technique based on a steepest-descent-based gradient search algorithm and demonstrates its utility in performance tuning of a 2.4-GHz transmitter system.</p><p align="right"><it>&#x2014;Rahul Rao, IBM</it></p>
INDEX TERMS
design and test, RF system, submicron technology, process variation, yield improvement, self tuning, postmanufacture tuning, analog tuning, optimization, tuning knobs, manufacturing cost
CITATION
Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, "Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems", IEEE Design & Test of Computers, vol.27, no. 6, pp. 6-17, November/December 2010, doi:10.1109/MDT.2010.123
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