This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Swarup Bhunia, Case Western Reserve University
Rahul Rao, IBM T.J. Watson Research Center

This special issue presents six articles that highlight challenges, and approaches toward improving, design yield and reliability through postsilicon optimizations. The articles cover postsilicon adaptation and repair issues in a wide range of areas including analog circuits, embedded memories, and multicore systems.

Index Terms:
design and test, built-in self-repair, calibration, many-core, multicore, postsilicon optimization, reliability, self-repair, thermal management, yield improvement
Citation:
Swarup Bhunia, Rahul Rao, "Guest Editors' Introduction: Managing Uncertainty through Postfabrication Calibration and Repair," IEEE Design & Test of Computers, vol. 27, no. 6, pp. 4-5, Nov.-Dec. 2010, doi:10.1109/MDT.2010.134
Usage of this product signifies your acceptance of the Terms of Use.