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November/December 2010 (vol. 27 no. 6)
pp. 2

This issue of D&T features six articles on postsilicon calibration and repair. The articles span both design and test aspects of chip and system design, and highlight the interplay between design and test solutions.

Index Terms:
design and test, calibration and repair, low-power, mixed-signal, postsilicon tuning, parameter variation, process variation, yield and reliability
Citation:
Krishnendu Chakrabarty, "Increasing yield and reliability through postsilicon tuning," IEEE Design & Test of Computers, vol. 27, no. 6, pp. 2, Nov.-Dec. 2010, doi:10.1109/MDT.2010.135
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