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| Alodeep Sanyal, Syed M. Alam, Sandip Kundu, "BIST to Detect and Characterize Transient and Parametric Failures," IEEE Design & Test of Computers, vol. 27, no. 5, pp. 50-59, September/October, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2010.30, author = {Alodeep Sanyal and Syed M. Alam and Sandip Kundu}, title = {BIST to Detect and Characterize Transient and Parametric Failures}, journal ={IEEE Design & Test of Computers}, volume = {27}, number = {5}, issn = {0740-7475}, year = {2010}, pages = {50-59}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.30}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - BIST to Detect and Characterize Transient and Parametric Failures IS - 5 SN - 0740-7475 SP50 EP59 EPD - 50-59 A1 - Alodeep Sanyal, A1 - Syed M. Alam, A1 - Sandip Kundu, PY - 2010 KW - design and test KW - soft error KW - parametric failure KW - BIST KW - linear feedback shift register KW - multiple input signature register VL - 27 JA - IEEE Design & Test of Computers ER - | |||
The continual scaling of device dimensions is increasing both parametric failures, stemming from circuit marginality issues, and soft errors, from the impact of high-energy particles on semiconductor surfaces. Effectively detecting and estimating such intermittent failures is crucial for reliability, availability, and serviceability (RAS) characterization of chips. This BIST-based approach distinguishes intermittent failures from permanent failures and reduces test time and cost.
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