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BIST to Detect and Characterize Transient and Parametric Failures
September/October 2010 (vol. 27 no. 5)
pp. 50-59
Alodeep Sanyal, Synopsys
Syed M. Alam, Everspin Technologies
Sandip Kundu, University of Massachusetts at Amherst

The continual scaling of device dimensions is increasing both parametric failures, stemming from circuit marginality issues, and soft errors, from the impact of high-energy particles on semiconductor surfaces. Effectively detecting and estimating such intermittent failures is crucial for reliability, availability, and serviceability (RAS) characterization of chips. This BIST-based approach distinguishes intermittent failures from permanent failures and reduces test time and cost.

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Index Terms:
design and test, soft error, parametric failure, BIST, linear feedback shift register, multiple input signature register
Alodeep Sanyal, Syed M. Alam, Sandip Kundu, "BIST to Detect and Characterize Transient and Parametric Failures," IEEE Design & Test of Computers, vol. 27, no. 5, pp. 50-59, Sept.-Oct. 2010, doi:10.1109/MDT.2010.30
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