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| Michele Portolan, Suresh Goyal, Bradford Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook, "A Common Language Framework for Next-Generation Embedded Testing," IEEE Design & Test of Computers, vol. 27, no. 5, pp. 36-49, September/October, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2010.1, author = {Michele Portolan and Suresh Goyal and Bradford Van Treuren and Chen-Huan Chiang and Tapan J. Chakraborty and Thomas B. Cook}, title = {A Common Language Framework for Next-Generation Embedded Testing}, journal ={IEEE Design & Test of Computers}, volume = {27}, number = {5}, issn = {0740-7475}, year = {2010}, pages = {36-49}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.1}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - A Common Language Framework for Next-Generation Embedded Testing IS - 5 SN - 0740-7475 SP36 EP49 EPD - 36-49 A1 - Michele Portolan, A1 - Suresh Goyal, A1 - Bradford Van Treuren, A1 - Chen-Huan Chiang, A1 - Tapan J. Chakraborty, A1 - Thomas B. Cook, PY - 2010 KW - design and test KW - test generation KW - languages KW - built-in tests KW - testing strategies KW - testing tools KW - NSDL KW - IEEE P1687 VL - 27 JA - IEEE Design & Test of Computers ER - | |||
This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow.
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