This Article 
 Bibliographic References 
 Add to: 
A Common Language Framework for Next-Generation Embedded Testing
September/October 2010 (vol. 27 no. 5)
pp. 36-49
Michele Portolan, Bell Labs Ireland
Suresh Goyal, Alcatel-Lucent Bell Labs
Bradford Van Treuren, Alcatel-Lucent Bell Labs
Chen-Huan Chiang, Alcatel-Lucent Bell Labs
Tapan J. Chakraborty, Alcatel-Lucent Bell Labs
Thomas B. Cook, Alcatel-Lucent Bell Labs

This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow.

1. IEEE Std. 1149.1-2001, IEEE Standard Test Access Port and Boundary-Scan Architecture, IEEE, 2001.
2. IJTAG – IEEE P1687;
3. The System JTAG Working Group; http:/
4. Serial Vector Format Specification, revision E, part no. ASSET-SVF-DOC, Asset InterTech, 8 Mar. 1999; .
5. Standard Test and Programming Language, JESD-71, Joint Electron Devices Eng. Council, Aug. 1999.
6. J. Rearick and A. Volz, "A Case Study of Using IEEE P1687 (IJTAG) for High-Speed Serial I/O Characterization and Testing," Proc. Int'l Test Conf. (ITC 06), vol. 1, IEEE CS Press, 2006, pp. 314-321.
7. K. Posse et al., "IEEE P1687: Toward Standardized Access of Embedded Instrumentation," Proc. Int'l Test Conf. (ITC 06), vol. 2, IEEE CS Press, 2006, pp. 1045-1052.
8. A.L. Crouch, "IJTAG: The Path to Organized Instrument Connectivity," Proc. Int'l Test Conf. (ITC 07), vol. 2, IEEE CS Press, 2007, pp. 922-931.
9. J. Doege and A.L. Crouch, "The Advantages of Limiting P1687 to a Restricted Subset," Proc. Int'l Test Conf. (ITC 08), IEEE CS Press, 2008, paper 34.1.
10. "Hierarchical Scan Description Language (HSDL)," ASSET InterTech; , 1992.
11. "VASG: VHDL Analysis and Standardization Group," IEEE; http://www.eda.orgvhdl-200x.
12. "The FreeHDL Project" ; http:/

Index Terms:
design and test, test generation, languages, built-in tests, testing strategies, testing tools, NSDL, IEEE P1687
Michele Portolan, Suresh Goyal, Bradford Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook, "A Common Language Framework for Next-Generation Embedded Testing," IEEE Design & Test of Computers, vol. 27, no. 5, pp. 36-49, Sept.-Oct. 2010, doi:10.1109/MDT.2010.1
Usage of this product signifies your acceptance of the Terms of Use.