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A Common Language Framework for Next-Generation Embedded Testing
September/October 2010 (vol. 27 no. 5)
pp. 36-49
Michele Portolan, Bell Labs Ireland
Suresh Goyal, Alcatel-Lucent Bell Labs
Bradford Van Treuren, Alcatel-Lucent Bell Labs
Chen-Huan Chiang, Alcatel-Lucent Bell Labs
Tapan J. Chakraborty, Alcatel-Lucent Bell Labs
Thomas B. Cook, Alcatel-Lucent Bell Labs

This article describes the New Scan Description Language (NSDL), which can efficiently describe embedded-testing resources for automated test generation. The authors evaluate NSDL in the context of the proposed IEEE P1687 standard. They conduct a theoretical analysis for each requirement of this standard and identify the NSDL code solution for each point. They also explain how NSDL naturally fits into an automated test flow.

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Index Terms:
design and test, test generation, languages, built-in tests, testing strategies, testing tools, NSDL, IEEE P1687
Citation:
Michele Portolan, Suresh Goyal, Bradford Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook, "A Common Language Framework for Next-Generation Embedded Testing," IEEE Design & Test of Computers, vol. 27, no. 5, pp. 36-49, Sept.-Oct. 2010, doi:10.1109/MDT.2010.1
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