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| Koh Johguchi, Akihiro Kaya, Shinya Izumi, Hans Mattausch, Tetsushi Koide, Norio Sadachika, "Measurement-Based Ring Oscillator Variation Analysis," IEEE Design & Test of Computers, vol. 27, no. 5, pp. 6-13, September/October, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2010.57, author = {Koh Johguchi and Akihiro Kaya and Shinya Izumi and Hans Mattausch and Tetsushi Koide and Norio Sadachika}, title = {Measurement-Based Ring Oscillator Variation Analysis}, journal ={IEEE Design & Test of Computers}, volume = {27}, number = {5}, issn = {0740-7475}, year = {2010}, pages = {6-13}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.57}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Measurement-Based Ring Oscillator Variation Analysis IS - 5 SN - 0740-7475 SP6 EP13 EPD - 6-13 A1 - Koh Johguchi, A1 - Akihiro Kaya, A1 - Shinya Izumi, A1 - Hans Mattausch, A1 - Tetsushi Koide, A1 - Norio Sadachika, PY - 2010 KW - design and test KW - within-wafer variation KW - within-die variation KW - CMOS KW - ring oscillators KW - compact model KW - surface potential KW - low power VL - 27 JA - IEEE Design & Test of Computers ER - | |||
As transistor size scales down, unavoidable process variations are rapidly increasing. Consequently, it's essential for designers to accurately estimate within-die and interdie variations so that circuits and integrated systems can operate correctly. This article describes an analysis of ring oscillators that were designed in 180-nm and 100-nm CMOS technologies, and discusses the oscillators' frequency variations as determined for different stage numbers and supply voltages.
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