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September/October 2010 (vol. 27 no. 5)
pp. 4

This issue of D&T features five articles on next-generation design and test innovations and the associated problems that face the design-and-test community.

Index Terms:
design and test, embedded testing, MPSoC, process variation, task mapping, timing analysis
Citation:
"Next-generation design and test innovations," IEEE Design & Test of Computers, vol. 27, no. 5, pp. 4, Sept.-Oct. 2010, doi:10.1109/MDT.2010.110
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