The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.05 - September/October (2010 vol.27)
pp: 4
ABSTRACT
<p>This issue of <it>D&#x0026;T</it> features five articles on next-generation design and test innovations and the associated problems that face the design-and-test community.</p>
INDEX TERMS
design and test, embedded testing, MPSoC, process variation, task mapping, timing analysis
CITATION
"Next-generation design and test innovations", IEEE Design & Test of Computers, vol.27, no. 5, pp. 4, September/October 2010, doi:10.1109/MDT.2010.110
SEARCH
5 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool