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July/August 2010 (vol. 27 no. 4)
pp. 78-79

This month's Test Technology TC Newsletter features highlights of past events—28th IEEE VLSI Test Symposium and 19th IEEE North Atlantic Test Workshop—and upcoming events: 16th IEEE International On-Line Testing Symposium, 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, and 40th International Test Conference.

Index Terms:
DFT 2010, IOLTS 2010, ITC 2010, NATW 2010, VTS 2010
Citation:
"Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 27, no. 4, pp. 78-79, July-Aug. 2010, doi:10.1109/MDT.2010.91
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