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Issue No.03 - May/June (2010 vol.27)
pp: 78-79
ABSTRACT
<p>This month's Test Technology TC Newsletter features highlights of past events&#x2014;11th IEEE Latin-American Test Workshop; Design, Automation and Test in Europe (DATE 2010)&#x2014;and upcoming events: 3rd IEEE International Symposium on Hardware, and the 16th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop.</p>
INDEX TERMS
DATE 2010, HOST 2010, IMS3TW 2010, LATW 2010
CITATION
"Test Technology TC Newsletter", IEEE Design & Test of Computers, vol.27, no. 3, pp. 78-79, May/June 2010, doi:10.1109/MDT.2010.72
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