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May/June 2010 (vol. 27 no. 3)
pp. 78-79

This month's Test Technology TC Newsletter features highlights of past events—11th IEEE Latin-American Test Workshop; Design, Automation and Test in Europe (DATE 2010)—and upcoming events: 3rd IEEE International Symposium on Hardware, and the 16th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop.

Index Terms:
DATE 2010, HOST 2010, IMS3TW 2010, LATW 2010
Citation:
"Test Technology TC Newsletter," IEEE Design & Test of Computers, vol. 27, no. 3, pp. 78-79, May-June 2010, doi:10.1109/MDT.2010.72
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