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May/June 2010 (vol. 27 no. 3)
pp. 75
Rohit Kapur, Synopsys
Reports on China Semiconductor Technology International Conference and DELTA 2010, IEEE Symposium on Electronic Design, Test and Applications
Index Terms:
China Semiconductor Technology International Conference, DELTA 2010
Citation:
Rohit Kapur, "Conference Reports," IEEE Design & Test of Computers, vol. 27, no. 3, pp. 75, May-June 2010, doi:10.1109/MDT.2010.64
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