|
| This Article | ||
| | ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
| ||
| ASCII Text | x | ||
| Rohit Kapur, "Conference Reports," IEEE Design & Test of Computers, vol. 27, no. 3, pp. 75, May/June, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2010.64, author = {Rohit Kapur}, title = {Conference Reports}, journal ={IEEE Design & Test of Computers}, volume = {27}, number = {3}, issn = {0740-7475}, year = {2010}, pages = {75}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.64}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Conference Reports IS - 3 SN - 0740-7475 SP EP EPD - 75 A1 - Rohit Kapur, PY - 2010 KW - China Semiconductor Technology International Conference KW - DELTA 2010 VL - 27 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.64
Reports on China Semiconductor Technology International Conference and DELTA 2010, IEEE Symposium on Electronic Design, Test and Applications
Index Terms:
China Semiconductor Technology International Conference, DELTA 2010
Citation:
Rohit Kapur, "Conference Reports," IEEE Design & Test of Computers, vol. 27, no. 3, pp. 75, May-June 2010, doi:10.1109/MDT.2010.64
Usage of this product signifies your acceptance of the Terms of Use.