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Issue No.03 - May/June (2010 vol.27)
pp: 75
Rohit Kapur , Synopsys
ABSTRACT
Reports on China Semiconductor Technology International Conference and DELTA 2010, IEEE Symposium on Electronic Design, Test and Applications
INDEX TERMS
China Semiconductor Technology International Conference, DELTA 2010
CITATION
Rohit Kapur, "Conference Reports", IEEE Design & Test of Computers, vol.27, no. 3, pp. 75, May/June 2010, doi:10.1109/MDT.2010.64
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