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Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis
May/June 2010 (vol. 27 no. 3)
pp. 54-61
Manish Sharma, Mentor Graphics, Wilsonville
Chris Schuermyer, Mentor Graphics, Wilsonville
Brady Benware, Mentor Graphics, Wilsonville

The cost and cycle time for determining the root cause of yield loss continues to increase as semiconductor technology scales down. A new technique, Axiom, helps yield and product engineers determine the root cause of loss directly from diagnosis results. Consequently, root-cause cycle time is dramatically reduced, resulting in a higher physical-failure analysis success rate and reduced costs.

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Index Terms:
Axiom, design and test, test failure data, yield loss, diagnosis-driven yield analysis
Manish Sharma, Chris Schuermyer, Brady Benware, "Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis," IEEE Design & Test of Computers, vol. 27, no. 3, pp. 54-61, May-June 2010, doi:10.1109/MDT.2009.94
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