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Economic Analysis of the HOY Wireless Test Methodology
May/June 2010 (vol. 27 no. 3)
pp. 20-30
YuTsao Hsing, National Tsing Hua University, Hsinchu
LiMing Denq, National Tsing Hua University, Hsinchu
Chao-Hsun Chen, National Tsing Hua University, Hsinchu
Cheng-Wen Wu, National Tsing Hua University, Hsinchu

The HOY (Hypothesis, Odyssey, and Yield) test system provides wireless test access and embedded DFT, while offering lower cost and better performance than conventional ATE. This article briefly describes HOY, then proposes a test cost model to compare it with conventional ATE, and analyzes the test cost of these two methods for different manufacturing processes, area overheads, die sizes, manufacturing volumes, and test times.

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Index Terms:
design and test, wireless testing, test cost model, DFT, HOY, cost estimation
Citation:
YuTsao Hsing, LiMing Denq, Chao-Hsun Chen, Cheng-Wen Wu, "Economic Analysis of the HOY Wireless Test Methodology," IEEE Design & Test of Computers, vol. 27, no. 3, pp. 20-30, May-June 2010, doi:10.1109/MDT.2009.96
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