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Issue No.03 - May/June (2010 vol.27)
pp: 2
ABSTRACT
<p>This issue of <it>D&#x0026;T</it> includes five articles on various aspects of testing. The issue leads off with a tutorial on software-based self-testing of microprocessors, followed by four in-depth articles on aspects of test technology. This issue also features the second part of a Perspectives article on an NSF workshop. Columns include The Road Ahead, Book Reviews, and Conference Reports.</p>
INDEX TERMS
design and test, fault diagnosis, process methodology, self-testing
CITATION
"Enabling design and manufacturing through innovations in DFT", IEEE Design & Test of Computers, vol.27, no. 3, pp. 2, May/June 2010, doi:10.1109/MDT.2010.74
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