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May/June 2010 (vol. 27 no. 3)
pp. 2

This issue of D&T includes five articles on various aspects of testing. The issue leads off with a tutorial on software-based self-testing of microprocessors, followed by four in-depth articles on aspects of test technology. This issue also features the second part of a Perspectives article on an NSF workshop. Columns include The Road Ahead, Book Reviews, and Conference Reports.

Index Terms:
design and test, fault diagnosis, process methodology, self-testing
Citation:
"Enabling design and manufacturing through innovations in DFT," IEEE Design & Test of Computers, vol. 27, no. 3, pp. 2, May-June 2010, doi:10.1109/MDT.2010.74
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