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CEDA Currents (HTML)
January/February 2010 (vol. 27 no. 1)
pp. 86-87
ASCII Text
x 
 
"CEDA Currents," IEEE Design & Test of Computers, vol. 27, no. 1, pp. 86-87, January/February, 2010.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2010.13,
author = {},
title = {CEDA Currents},
journal ={IEEE Design & Test of Computers},
volume = {27},
number = {1},
issn = {0740-7475},
year = {2010},
pages = {86-87},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.13},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - CEDA Currents
IS - 1
SN - 0740-7475
SP86
EP87
EPD - 86-87
PY - 2010
KW - Early Career Award
KW - EDAC Kaufman Award
KW - ICCAD and VLSI-SoC Best Paper Awards
KW - IEEE Embedded Systems Letter
VL - 27
JA - IEEE Design & Test of Computers
ER -
 

Among this month's CEDA Currents newsletter items are awards—the EDAC Kaufman Award, ICCAD and VLSI-SoC Best Paper Awards, and Early Career Award—the IEEE Embedded Systems Letters' most-accessed articles, and upcoming CEDA events.

Index Terms:
Early Career Award, EDAC Kaufman Award, ICCAD and VLSI-SoC Best Paper Awards, IEEE Embedded Systems Letter
Citation:
"CEDA Currents," IEEE Design & Test of Computers, vol. 27, no. 1, pp. 86-87, Jan.-Feb. 2010, doi:10.1109/MDT.2010.13
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