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| "CEDA Currents," IEEE Design & Test of Computers, vol. 27, no. 1, pp. 86-87, January/February, 2010. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2010.13, author = {}, title = {CEDA Currents}, journal ={IEEE Design & Test of Computers}, volume = {27}, number = {1}, issn = {0740-7475}, year = {2010}, pages = {86-87}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.13}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - CEDA Currents IS - 1 SN - 0740-7475 SP86 EP87 EPD - 86-87 PY - 2010 KW - Early Career Award KW - EDAC Kaufman Award KW - ICCAD and VLSI-SoC Best Paper Awards KW - IEEE Embedded Systems Letter VL - 27 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2010.13
Among this month's CEDA Currents newsletter items are awards—the EDAC Kaufman Award, ICCAD and VLSI-SoC Best Paper Awards, and Early Career Award—the
Index Terms:
Early Career Award, EDAC Kaufman Award, ICCAD and VLSI-SoC Best Paper Awards, IEEE Embedded Systems Letter
Citation:
"CEDA Currents," IEEE Design & Test of Computers, vol. 27, no. 1, pp. 86-87, Jan.-Feb. 2010, doi:10.1109/MDT.2010.13
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