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IEEE Design & Test of Computers
January/February 2010 (vol. 27 no. 1)
ISSN: 0740-7475
Table of Contents
Call for Papers
From the EIC
Verifying Physical Trustworthiness of ICs and Systems
Yier Jin, Yale University
Yiorgos Makris, Yale University
pp. 26-35
Kurt Rosenfeld, Polytechnic Institute of New York University
Ramesh Karri, Polytechnic Institute of New York University
pp. 36-47
Alex Baumgarten, Microsoft
Akhilesh Tyagi, Iowa State University
Joseph Zambreno, Iowa State University
pp. 66-75
Feature Article
Lingkan Gong, East China Institute of Computer Technology
Jingfen Lu, East China Institute of Computer Technology
pp. 76-85
CEDA Currents
DATC Newsletter
TTTC Newsletter
Conference Reports
Book Reviews
The Last Byte
Miodrag Potkonjak, University of California, Los Angeles
pp. 96-98
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