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Issue No.06 - November/December (vol.26)
ISSN: 0740-7475
From the EIC
Call for Papers
Reliability Challenges in Nano-CMOS Design
Yu Cao , Arizona State University
Jim Tschanz , Intel
Pradip Bose , IBM Thomas J. Watson Research Center
pp. 6-7
Sang Phill Park , Purdue University
Kunhyuk Kang , Intel
Kaushik Roy , Purdue University
pp. 8-17
Muhammad Bashir , Georgia Institute of Technology
pp. 18-27
Young Moon Kim , Stanford University
Yanjing Li , Stanford University
Subhasish Mitra , Stanford University
pp. 28-39
Cheng Zhuo , University of Michigan
Eric Karl , Intel Portland Technology Development
David Blaauw , University of Michigan
Prashant Singh , University of Michigan
pp. 40-49
Dongwoo Lee , Korea Aerospace University
Jongwhoa Na , Korea Aerospace University
pp. 50-61
Jude A. Rivers , IBM Thomas J. Watson Research Center
Prabhakar Kudva , IBM Thomas J. Watson Research Center
pp. 62-73
Other Features
Tero Vallius , University of Oulu
pp. 74-83
Iakovos Mavroidis , Technical University of Crete
Ioannis Papaefstathiou , Technical University of Crete
pp. 84-94
CEDA Currents (HTML)
pp. 100-101
Scott Davidson , Sun Microsystems
pp. 104
Annual Index
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