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IEEE Design & Test of Computers
November/December 2009 (vol. 26 no. 6)
ISSN: 0740-7475
Table of Contents
From the EIC
Call for Papers
Reliability Challenges in Nano-CMOS Design
Yu Cao, Arizona State University
Jim Tschanz, Intel
Pradip Bose, IBM Thomas J. Watson Research Center
pp. 6-7
Muhammad Bashir, Georgia Institute of Technology
Linda Milor, Georgia Institute of Technology
pp. 18-27
Yanjing Li, Stanford University
Young Moon Kim, Stanford University
Evelyn Mintarno, Stanford University
Subhasish Mitra, Stanford University
pp. 28-39
Prashant Singh, University of Michigan
Cheng Zhuo, University of Michigan
Eric Karl, Intel Portland Technology Development
David Blaauw, University of Michigan
Dennis Sylvester, University of Michigan
pp. 40-49
Dongwoo Lee, Korea Aerospace University
Jongwhoa Na, Korea Aerospace University
pp. 50-61
Jude A. Rivers, IBM Thomas J. Watson Research Center
Prabhakar Kudva, IBM Thomas J. Watson Research Center
pp. 62-73
Other Features
Tero Vallius, University of Oulu
Juha Röning, University of Oulu
pp. 74-83
Iakovos Mavroidis, Technical University of Crete
Ioannis Mavroidis, Technical University of Crete
Ioannis Papaefstathiou, Technical University of Crete
pp. 84-94
Departments
Annual Index
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